Silicates

Orthosilicates

Gadolinum and lutetium orthosilicate single crystals and their solid solutions ((Lu1-xGdx)2SiO5), were grown using Czochralski method. Structural and spectroscopic measurements were performed.

Obtained crystals:

  • Lutetium orthosilicate crystals
    Lu2SiO5 : Dy 1% and 5%

    Melting point c.a. 2050°C. Ir rod was used as seed. Transparent and almost colorless crystals with 20 mm of the diameter were grown from the 40 mm Ir cruicible.

    LSO:1% DyLSO:5% Dy

  • Gadolinum orthosilicate crystals
    Gd2SiO5 : Dy 1% and 5%
    Gd2SiO5 : Pr 0.2% and 1%
    Gd2SiO5 : Sm 0.5% and 5%
    Gd2SiO5 : Sm 1%, Ce 0.5%; Sm 0.5%, Ce 1%; Pr 1%, Ce 0.5%)

    Melting point c.a. 1980°C. Ir rod was used as seed. Transparent crystals with 20 mm of the diameter were grown from the 40 mm Ir cruicible. Strong tendency to cracking parallel to the cleavage plane (100) was observed.

    GSO:1% DyGSO:5% DyGSO:1% PrGSO:0.5% Sm, 1% Ce

  • Solid solution crystals
    (LuxGd1-x-yDyy)2SiO5 ; y=0.4 and x=0.192, 0.384, 0.576, 0.768
    (LuxGd1-x-ySmy)2SiO5 ; y=0.005 and x=0.095, 0.11, 0.125, 0.15, 0.17, 0.19, 0.35, 0.5

    Transparent and almost colorless crystals with 20 mm of the diameter were grown from the 40 mm Ir cruicible.

    20%GSO:80%LSO: Dy40%GSO:60%LSO: Dy60%GSO:40%LSO: Dy80%GSO:20%LSO: Dy



Cooperation with prof. Witold Ryba-Romanowski from Division of Optical Spectroscopy,
Institute of Low Temperature and Structure Research PAS

Oxyapatite Compounds

Neodymium and samarium silicates - Nd9.33(SiO4)6O2 and Sm9.33(SiO4)6O2 - were grown using Czochralski method. Strong tendency to spiral growth was observed. Optical and dielectrical measurements were performed.