INSTITUTE  OF  PHYSICS  PAS
LABORATORY OF X-RAY AND ELECTRON MICROSCOPY RESEARCH - SL1

Head of the laboratory: Dr. hab. Ryszard Sobierajski, prof. IP PAS  sobieraj@ifpan.edu.pl
Deputy head of the laboratory: Dr. hab. Sławomir Kret, prof. IP PAS  kret@ifpan.edu.pl
Secretary: MSc. Dorota Laskowska dlaskowska@ifpan.edu.pl
Phone: (+48-22) 843 60 34; (+48-22) 843 70 01 or 843 66 01 ext.2301;
SL1.1Group of X-ray optics and atomic structure research
SL1.2Group of X-ray spectroscopy and microanalysis
SL1.3Group of applied crystallography
SL1.4Group of electron microscopy

Main subject of research:
  • X-ray absorption and photoelectron studies of the electronic structure of materials.
  • XANES and EXAFS investigation of local structure in solids.
  • Determination of crystal-structure parameters of bulk materials and nanostructures by X-ray and electron diffraction methods.
  • Investigation of crystal defects by X-ray high resolution diffractometry and electron microscopy.
  • Investigation of structural properties of crystals as a function of composition, temperature and pressure.
  • Studies of strain and elastic properties of bulk materials and multilayers using X-ray diffraction methods.
  • SIMS investigation of content and distribution of trace elements and kinetics of dopants.
  • New methods for atomic and electronic structure studies low dimensional materials used in technology of electronic devices.
  • Rutherford backscattering spectrometry (analysis of sample composition) and ion channeling (measure of crystal structure).
  • Ion implantation, energy 250keV - 3 MeV.
Materials studied:
  • AIIIBV compounds bulk and nanostructures (pure and doped).
  • Nanostructures of AIIBVI compounds (including semimagnetic semiconductors, pure and doped).
  • High temperature superconductors - thin films and bulk crystals.
  • Composites.
  • Ceramics.
  • Transition metal complexes with coumarin and thiourea derivatives.
  • Materials for biomedical applications.
  • Bulk and low-dimensional semiconductor materials and systems, superconductors, magnetic compounds.
  • Bulk oxide materials, mostly those potentially applicable in optoelectronics.
  • And others.
Major facilities:
  • X-ray/UV photoelectron spectroscopy (XPS/UPS)
  • FEG monochromated Cs image corrected Transmission Electron Microscope Titan CUBED 80-300.
  • High resolution transmission electron microscope JEM 2000 EX (JEOL).
  • High-resolution X'Pert MRD (Materials Research Diffractometer) diffractometer (supplied by Philips, now Panalytical) equipped with Cu X-ray tube, parabolic X-ray mirror, germanium (220) asymmetrical Bartels monochromator giving monochromatic beam with divergence 20", germanium (220) analyzer; high-temperature chamber.
  • X'Pert MPD (Multi-Purpose Diffractometer) diffractometer/reflectometer (supplied by Philips, now Panalytical) equipped with Cu X-ray tube, germanium (111) Johansson monochromator, semiconductor linear position-sensitive detector
  • Secondary ion mass spektrometer Cameca IMS 6f.
  • Accelerator 3SDH-2 Pelletron.
  • Infrared spectroscopy (FTIR).
  • UV-Vis Spectrophotometer.
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