Centre of Photon, Electron and
Ion Advanced Methods for Natural Science CEPHEUS
Workshop on Advanced Method for Interpretation
of TEM, X-Ray and SIMS Measurements in Nano and Atomic Scale
1-3
June 2005
Announcement Poster
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A4_plakat.pdf (1261KB)
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A3_plakat.pdf (1931KB)
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Invited
Speakers:
Prof.
V.Holy
Masaryk
University,
Faculty of
Sciences
61137 Brno,
Czech
Republic
Lecture: X-ray investigation of self-organized semiconductor
nanostructures
Dr
Massimo Bersani
Physics and Chemistry
Of Surface and Interface Division
Via
Sommarive 18
38050
Povo-Trento
Italy
Lecture: Ultra Shallow Depth
Profiling by SIMS in microelectronic materials and processes
Dr
Ana Sanchez
Depto.
Ciencias Materiales
E I.M. y
Q.I.
Facultad de
Ciencias
Campus
Universitario de Puerto Real
11510
Puerto Real
Cadiz,
Spain
Lecture: The plasmon peak in EELS: A new technique to determine
the strain in semiconductor heterostructures?
Dr
Pedro L. Galindo Riano
Depto.
Lenguajes y Sistemas Informaticos
Facultad de
Ciencias
Campus
Universitario de Puerto Real
11510
Puerto Real
Cadiz,
Spain
Lecture: The peak Pairs strain mapping algorithm and its
application to HRTEM images
Dr
Martin Hyetch
CECM-CNRS
15, rue
Georges Urbain
94407
Vitry-sur-Seine
France
Lecture: Geometric Phase Method and their application in materials characterization
Prof. Andreas Rosenauer
IFP-University Bremen,
Otto-Hahn-Alee 1
28359 Bremen
Germany
Lecture: Composition evaluation by lattice fringe
analysis (CELFA) in semiconductors nanostructures investigation
Dr Hubert Renevier
Commissariat a l’ Energie Atomique
Department de Recherche Fondamentale
Sur la Matiere Condense
France
Lecture: Grazing Incidence Anomalous Diffraction and Diffraction Anomalous Fine Structure (GIDAFS) to study nanostructures
Prof. Sven Hovmoeller
Stockholm University,
Structural Chemistry
SE-10691 Stockholm
Sweden
Lecture: Computer aided electron crystallography as
powerful tool to structure determination
Dr Kurt Scheerschmidt
Max Planck Institute of
Microstructure Physics
Weinberg 2
D-06120 Halle
Germany
Lecture: Molecular dynamics modeling for enhanced interpretation of TEM images
Dr Erik Knudsen
Riso National Laboratory
P.O. Box 49
DK-4000 Roskilde
Denmark
Lecture: Algorithms and Instrumentation for generating
3d grain maps in polycrystals by 3DXRD
Scope of the Workshop:
q
Selected revue of new
approaches to computer methods for data analysis;
q
Theoretical and
practical presentation of modern method of experimental data acquisition and
processing;
q
Presentation and
comparison of possibility and limitation of different experimental techniques
used for structure characterization in nano and atomic scale.
q
Computer methods of
structure modeling applied to interpretation of experimental measurements;
Overview of lecture
topics area
Progress in physics and technology
requires quantitative information about internal structure in nanometer
and atomic scales of modern materials.
New measurement methods like
synchrotron radiation (XRSR), high resolution transmission electron microscopy,
secondary ion mass spectroscopy (SIMS) offer information owing to advanced
computer aid processing of raw experimental data. Even correctly performed
experiment and data processing with all states of art procedure and tricks
usually do not give simple reply to questions about internal structure. The
quantitative interpretation of data needs strong physical background of
experiment and understanding of its key parameters, knowledge of instrument
limitation, etc. It is important to identify the possible sources of artifacts
and their impact on results. Nowadays, the simulation based on the realistic
model of investigated object and experiment is necessary to correct the
interpretation of data.
The way from the raw data to
physical quantities can be divided into two main steps:
- visualization, storage, systematization, calibration and
deconvolution of data,
- quantitative comparing of theoretical models of object and
experiment simulation with “real word” results.
During the Workshop the invited
speakers will present new and the most effective methodology of chosen
experimental techniques, such as X-Ray, SIMS, and TEM/HRTEM areas, appropriate
for characterization of nanostructures and nanomaterials like: quantum
structures, integrated devices, nanocrystalline materials.
A part of the Workshop will be
concerned with presentation of the methods creating a realistic computer model
of investigated sample and its application to data interpretation. Such a model
can be generated by means of the molecular dynamics where the probable
configuration of defect cores and interface at atomic level exist. However, in
larger scale the continuum approach, applying the finite element methods, is
better adopted to model a probable stress state and chemical gradients in
investigated sample.
Formula of the
Workshop
Tutorial plenary lectures will be
addressed to researchers and Ph.D students having the basic knowledge of each of
the experimental methods (SIMS, X-Ray, TEM). Additionally, the spare time will
be reserved for discussion and computer exercises in small groups (3-8
persons).
Workshop will be held at the Institute of Physics of the Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland.
Workshop Organizers
Chairperson: S. Kret kret@ifpan.edu.pl
Secretary: H. Granat granat@ifpan.edu.pl
Report
Workshop on Advanced Method for
Interpretation of TEM, X-Ray and SIMS Measurements in Nano and Atomic Scale”,
Warszawa 1-3 June 2005.
The Workshop was organized in the framework of the European Program
Centre of Excellence CEPHEUS.
During the
Workshop invited talks were devoted to presentation of the
most advanced recent methods of
interpretation of the transmission
electron microscopy images, x-ray
diffraction and absorption
spectra as well the SIMS measurements. The lectures had a tutorial
and revue character permitting the young scientists to learn about recent developments.
Both the principles of these methods, source of artifact and the error and precision of such measurements
were presented by the experts.
The participants who were mostly the
young people and experienced
scientists had the possibility to deepen his knowledge or learn
about new developments in structural characterization of materials in nanometrric scale. Especially , there was
opportunity to compare possibilities of
these methods giving information about
local structure, as the quantitative transmission
electron microscopy, with the
information delivered by the
synchrotron radiation techniques giving averaged information from a bigger volume.
The invited specialists
usually presented unpublished data and newly developed concepts. The talks were
interrupted by questions of
participants thus, the rule was 10
minutes discussions after each lecture.
Abstracts of all lectures
were collected in the Workshop’s
booklet. Every author was asked to introduce into his article the main idea of experimental methods,
examples of results and references permitting
deeper learning and understanding.
The exercises and free discussions gave the
opportunity to concentrate
participant’s attention to the
particular problems and to
obtain the assistance from the invited experts in solving these problems.
During 3 days’ meeting 18
lectures were performed by the invited specialists from the Europe, (10 speakers from the best European research
centers, invited within the European Community Program Centre of Excellence
“CEPHEUS”). Lectures as well 5 hours
exercises were hold in the Institute of Physics. In total 72 participants were participated in the
Workshop .