last updated: May 6, 1998
ISSRNS'98

 

LIST OF POSTER CONTRIBUTIONS
ordered by the name of presenting person (underlined)
 
 
  1. I.V. Antonova, J. Bak-Misiuk, A. Misiuk, V.P. Popov, A.E. Plotnikov; Dependence of oxygen precipitate size and of strain on external stress during sample annealing; B4
  2. J. Auleytner, L. Datsenko, A. Misiuk, V. Machulin, V. Kladko, V. Mielnik, I. Prokopenko; Influence of hydrostatic pressure on the defect structure of Czochralski grown silicon in the temperature range of oxygen precipitate dissolution in the silicon matrix; A6
  3. J. Bak-Misiuk, J. Adamczewska, J. Domagała, Z.R. Zytkiewicz, A. Misiuk, M. Leszczyński, H.B. Surma; Influence of high hydrostatic pressure-high temperature on defect structure of semiconductors layers; B5
  4. J. Bak-Misiuk, A. Misiuk, H.B. Surma, J. Domagała, I.V. Antonova, V.P. Popov, A. Romano-Rodriguez, M. Lopez; Dependence of photoluminescence of silicon on conditions of pressure annealing; A5
  5. J. Bak-Misiuk, E. Dynowska, E. Janik, J. Domagała, T. Wojtowicz, J. Kossut; Direct measurement of the lattice parameter of thick stable zinc-blende MgTe layer; A15
  6. P. Byszewski, E. Kowalska, Z. Kucharski, P. Dłużewski; Fe:C60 bonds and structure analysed by computational chemistry methods; B31
  7. V.K. Chevokin, V.A. Podviaznikov, E.S. Sladkova, V.N. Shaliapin, S.I. Tiutiunnikov; Streak cameras for synchrotron radiation application; A3
  8. V. Degtyareva, W.B. Holzapfel; Structural transitions under pressure of heavy four-valent metals; B15
  9. N. Dmitruk, I. Dmitruk, J. Domagała, D. Klinger, D. Żymierska, J. Auleytner; X-ray diffraction and Raman scattering study of near-surface crystal perfection after anisotropic etching; A7
  10. I. Dmitruk, T. Mikhailik, D. Żymierska, J. Auleytner; Comparative studies of Si single crystals surface disorder by using various methods of electromagnetic waves scattering; B6
  11. J. Dzelme, I. Ertsinsh, B. Zapol, A. Misiuk; Structure and diffusion of oxygen and silicon interstitials in silicon ; A4
  12. D.L. Ederer, E. Kurmaev, S. Shin, T.A. Calcott, R.C.C. Perera, A. Moewes, J. van Ek, S. Stadler, R. Winarsky, L.J. Terminello, J.A. Carlisle, J. Jimenez, L. Zhou, E. Shirley; Soft X-ray emisssion and inelastic scattering excited by synchrotron radiation; A2
  13. H. Fiedorowicz, A. Bartnik, M. Szczurek, H. Daido, V. Kmetik, N. Sakaya, Y. Kato, T. Wilhein; Characterization of soft X-ray emission from a laser-irradiated gas puff target; B2
  14. P. Fita, K. Smoliński, Z. Gołacki, K. Ławniczak-Jabłońska; X-ray characterization of cerium doped PbTe and SnTe crystals; B23
  15. Z. Gołacki, B.J. Kowalski, E. Guziewicz, B.A. Orłowski, M. Heinonen; UPS resonant photoemission and XPS studies of uranium doped SnTe; A25
  16. J. Gronkowski, J. Borowski,; X-ray diffuse scattering from extended microdefects of orthorhombic symmetry for Si crystals; B9
  17. E. Guziewicz, B.J. Kowalski, B.A. Orlowski, R.L. Johnson; Hybridization of Mn3d electrons in Zn0.8Mn0.2Se; B25
  18. G. Hoelzer, E. Foerster, M. Deutsch, P. Beiersdorfer, H.F. Beyer; High-precision X-ray spectroscopy with crystals; B19
  19. R.J. Iwanowski, K. Fronc, W. Paszkowicz, M. Heinonen; XPS and XRD studies of crystalline 3C-SiC; A20
  20. R.J. Iwanowski, K. Ławniczak-Jabłonska, Z. Gołacki, A. Traverse; Tetrahedral covalent radii of Mn, Fe, Co and Ni estimated from EXAFS studies ; B21
  21. R.J. Iwanowski, M. Heinonen, I. Pracka; XPS study of LiNbO3:(Er,Yb) in the case of charged and neutralized surface; B20
  22. R.J. Iwanowski, M. Heinonen, I. Pracka, J. Raczyńska, K. Fronc, J.W. Sobczak; Application of in-situ surface scraping for extracting bulk component of XPS signal - example of LiNbO3 and GaSb; A21
  23. S.M. Kaczmarek, J. Wojtkowska, Z. Moroz, I. Pracka; Valency changes of impurities inside oxide compouds under proton irradiation; A33
  24. M.A. Kiselev, P. Lesieur, V.I. Gordeliy, C. Grabielle Madelmond, G. Keller, M. Ollivon; DMSO cryoprotection of DPPC membranes studied by calorimetry and X-ray diffraction ; B18
  25. N. Kulagin; Change of ions valency under crystal growth and treatment; A34
  26. J. Kutner, M. Szymański; Diffractometric measurements of epitaxial layers of diluted solid solutions; A14
  27. W.M. Kwiatek, T. Cichocki, T. Drewniak, M. Gajda, M. Gałka, M. Lekka; Distribution of selected elements in kidney cancerous tissue; B32
  28. B. Lesiak, A. Jóżwik; Application of the fuzzy kNN rule for quantitative analysis of AuPd alloys; A32
  29. M. Leszczyński, P. Prystawko, A. Śliwiński T. Suski, I. Grzegory, M. Boćkowski,, S. Porowski, J. Domagała, R. Langer, A. Barski, A. Barbier, C. Renaud; Crystallographic properties od AlGaN and InGaN layers examined using synchrotron and X-ray-tube radiation; A12
  30. M. Leszczyński, P. Prystawko, A. Śliwiński, T. Suski, I. Grzegory, B. Łucznik, S. Porowski, J. Domagała, R. Langer, A. Barski, A. Barbier, C. Renaud; Lattice parameters of GaN epitaxial layers on GaN single crystals, sapphire and SiC; A13
  31. K. Ławniczak-Jablońska, J. Kachniarz, Z.M. Spolnik; X-ray emission valence band spectra from Zn1-xFexS excited by electrons; A23
  32. K. Ławniczak-Jablońska, J. Libera, R.J. Iwanowski; EXAFS determination of local atomic structure of selected transition metals in CdSe matrix; A22
  33. K. Ławniczak-Jablońska, T. Suski, Z. Liliental-Weber, I. Gorczyca, N.E. Christensen, E.M. Gullikson, J.H. Underwood, T.J. Drummond, D.L. Ederer, R.C. Perera; Synchrotron radiation absorption and emission studies of the electronic structure in group III nitrides; B22
  34. J. Majewski; X-ray synchrotron studies of organic monolayers at air-water interface; A1
  35. A.A. Maltsev, M.A. Maltsev; Measurement of the angular divergence of infrared synchrotron radiation beams; B3
  36. E.A. Maximovskiy, N.I. Fainer, G.S. Yurjev, Yu.M. Rumyantsev, M.L. Kosinova, S.M. Zemskova; The structure study of thin cadmium and copper sulphide films by diffraction of synchrotron radiation; A8
  37. B. Mierzwa, Z. Kaszkur, B. Moraweck, J. Pielaszek; In-situ EXAFS study of the allloy catalyst Pd-Co (50%/50%)/SiO2; B28
  38. I.I. Mirenskaya, N.I. Shevtsov, A.B. Blank,; X-ray fluorescence determination of the stoichiometric composition of high-melting oxide systems: accuracy control; B36
  39. R. Nietubyć, E. Sobczak, O. Sipr, J. Vackar, A. Simunek; Electronic structure of silicon nitride; A27
  40. K. Turzyniecki; On the process of electron acceleration, Compton effect and synchrotron radiation; B34
  41. E.N. Ovchinnikova, V.E. Dmitrienko; Anisotropic X-ray anomalous scattering in incommensurately modulated crystals; B7
  42. W. Paszkowicz, J. Adamczyk, S. Krukowski, M. Leszczyński, S. Porowski, J. Sokołowski, M. Michalec, W. Łasocha; Thermal expansion of indium nitride; A11
  43. W. Paszkowicz, J. Domagała, M. Marczak, S. Łęgowski,, J. Szatkowski; Characterization of Bridgman grown Cd1-xMgxSe alloys; B11
  44. W. Paszkowicz, P. Dłużewski, Z. Spolnik, F. Firszt, H. Męczyńska; Formation of 4H and 8H polytypes in bulk Zn1-xMgxSe alloys; B12
  45. W. Paszkowicz, W. Szuszkiewicz, E. Dynowska, J. Domagała, B. Witkowska, M. Marczak, P. Zinn; High pressure-high temperature study of Hg1-xMnxS; A10
  46. J. Pełka, J. Auleytner, J. Domagała; Study of the near-surface layers modified by ion implantation in Si wafers by grazing incidence X-ray reflectometry; B10
  47. J. Pełka, L.T. Baczewski, J. Domagała, E. Dynowska, R. Kalinowski, A. Wawro; X-ray and magnetic study of thin films composed of W/RE/W and Y/RE/Y (RE=Gd, Tb) on sapphire and MgO substrates; A16
  48. J. Sass, K. Mazur; Reciprocal space mapping of the misfit dislocations related X-ray diffuse scattering in InxGa1-xAs/InP; B16
  49. M.R. Sharafutdinov, B.P. Tolochko, N.Z. Lyakhov; In-situ investigation of NiWO4 synthesis using synchrotron radiation; A18
  50. M.R. Sharafutdinov, M.A. Korchagin, B.P. Tolochko, V.V. Boldyrev; Investigation of self-propagation synthesis of TiBaO3 using synchrotron radiation; B17
  51. I.D. Shcherba, M.D. Koterlyn, L.O. Dobrians'ka, I.M. Telychyn, I.I. Margolych, B.M. Yactyk, R.R. Kytians'kyj; Mixed valence properties and chemical environment of ternary intermetallic compounds ; A31
  52. V.I. Smolniakov, I.A. Koltoun; High sensitive and high accuracy technique for processing of the energy-dispersive spectra of X-ray fluorescences with using of digital filters with variable parameters and corrections of the real shaped line nonlinearities as the new level of EDXRFS; B33
  53. J. Sokołowski; Analysis of some aspects of synchrotron radiation measurements reported in the inorganic crystal structure database; B8
  54. Y. Swilem, E. Sobczak, R. Nietubyć, A. Ślawska-Waniewska, M. Tischer; EXAFS analysis of grain boundaries in nanocrystalline Fe85Zr7B6Cu2 alloys; B29
  55. J. Szade, I. Karla, D. Gravel, M. Neumann; XPS and resonant photoemission investigation of Gd intermetallics; A29
  56. K. Szamota-Sadowska, B.J. Kowalski, E. Guziewicz, B.A. Orłowski, J.T. Sadowski, N. Barrett, A. Belsky, D. Martinotti, C. Guillot; Resonant photoemission study of rare earth 4f shell in II-VI crystals; A26
  57. E. Talik, M. Kulpa; Electronic structure of TbMn2 and DyMn2 single crystals; A30
  58. S. Tiutiunnikov, M. Kovalenko, V. Minashkin, V. Mironov, V. Shaliapin; Solid state position-sensitive detectors for X-ray spectroscopy; B1
  59. I.A. Vartaniants, J. Zegenhagen; Contribution of multipole terms to the photoelectric scattering process from an X-ray interference field; A35
  60. L. Vasylechko, L. Akselrud, A. Matkovskii, D. Savyckii, I. Syvorotka; Crystal structure of LaGaO3 and La(Gd)GaO3 solid solutions; A9
  61. M. Terekhin; VUV time-resolved spectroscopy of the fast scintillator materials with synchrotron radiation; B35
  62. W. Wierzchowski, K. Wieteska, W. Graeff, A. Turos; Interference fringes in plane wave topography of AlxGa1-xAs epitaxial layers implanted with Se ions; B13
  63. K. Wieteska, W. Wierzchowski, W. Graeff; White beam pin-hole patterns of implanted layers; A17
  64. D. Wilgocka-Ślężak, J. Żukrowski, K. Krop; Structural and magnetic properties of GdFe2 hydrides; B30
  65. R. Wojnecki, K. Ławniczak-Jabłonska; On the electronic structure of Ni3AlxFe1-x: LMTO calculation and X-ray spectroscopy; B24
  66. A. Wolska, R. Bacewicz, J. Filipowicz; Indium-rich phases in the Cu-In-Se system - crystal growth and characterization; B14
  67. P. Zajdel, A. Kisiel, M. Zimnal-Starnawska, P.M. Lee, F. Boscherini, W. Giriat; XANES study of sulphur K edges of transition metal (V, Cr, Mn, Fe, Co, Ni) monosulphides: experiment and LMTO numerical calculations; A28
  68. P. Zajdel, A. Kisiel, P.M. Lee, E. Buratini, W. Giriat; XANES study of K-edges of Fe, Co, Ni and Se in transition metal selenides. Experiment and comparison with LMTO numerical calculations; B26
  69. J. Zemek, S. Hucek, A. Jabłoński, I.S. Tilinin; Validity of the Beer-Lambert law in attenuation of photoelectrons; A24
  70. Xu Zhang-Cheng, G. Chang-Lin, Z. Zong-Yan, T. Fukamachi, R. Negishi, M. Yoshizawa, T. Sakamaki, T. Nakajima; The fluorescence emission from GaAs in the Laue case near the absorption edge; A19
  71. E. Żukowski, A. Andrejczuk, L. Dobrzyński, S. Kasprzyk, M.J. Cooper, J. Duffy, P. Suortti; Spin-dependent electron momentum distributions in Fe3Al and Fe3Si single crystals; B27