CONFERENCE FOR EXPERIMENTAL AND COMPUTING METHODS IN HIGH RESOLUTION
DIFFRACTION APPLIED FOR STRUCTURE CHARACTERISATION OF
MODERN MATERIALS
International Conference
on
Experimental and Computing Methods in High Resolution
Diffraction Applied for Structure Characterization of Modern Materials
HREDAMM
Zakopane, June 13-17, 2004
organised by
Institute of Physics, Polish Academy
of Science, Warsaw
European
Centre of Excellence
”CEPHEUS”
INTERNATIONAL ADVISORY BOARD
J. Baruchel (ESRF, Grenoble, France)
A. Fitch (ESRF, Grenoble,
France)
B. Hennion (CEA, Saclay,
France)
J. K¹tcki (IET, Warsaw, Poland)
R. Köhler (Humboldt
University, Germany)
M. Lefeld-Sosnowska (Warsaw University, Poland)
I. Sosnowska (Warsaw University,
Poland)
SCIENTIFIC AND ORGANISING COMMITTEE
|
J. Auleytner |
Honorary Chairman:
Chairperson: J. B¹k-Misiuk
Editor: K. £awniczak-Jab³oñska
Secretary: H. Granat
J. Gronkowski
P. D³u¿ewski
E. Dynowska
S. Kret
M. Leszczyñski
W. Paszkowicz
J. Ratajczak
LOCAL ORGANISING COMMITTEE
J. D¹browski, Z.
Liberadzka, J. Trela
LIST OF INVITED LECTURERS
Tilo Baumbach, Dresden, Germany,
“mm-resolved rocking curve imaging for the characterization
of semiconductor materials”
Michela Brunelli, Grenoble, France,
“Solving crystal
structures from powder diffraction data exploiting anisotropic thermal
expansion phenomenon”
Marc
DeBoissieu, Grenoble, France,
“Diffuse scattering
and phason fluctuations in quasicrystals”
Fabia Gozzo, Villigen, Switzerland,
Jerzy
Gronkowski, Warsaw, Poland,
“X-ray diffuse scattering
from statistically distributed defects”
Jurgen Härtwig, Grenoble, France,
“X-ray
diffraction and reciprocal space mapping of protein crystals”
Vaclav Holy, Brno, Czech Republic,
„Lateral
coherence mosaicity and dislocations density
at wide-gap
semiconductors”
Jung Ho Je, Pohang, Republic of Korea,
“The use of Bragg
and Fresnel diffraction synchrotron imaging for studying defects in modern
electronic materials“
Vladimir Kaganer, Berlin, Germany,
“How to extract maximum
information from X-ray diffraction peaks measured with finite resolution“
Henryk Kêpa,
Warsaw, Poland,
“Neutron
diffraction and reflectivity studies of Eu chalcogenides based superlattices”
Leszek Kêpiñski,
Wroc³aw, Poland,
„Microscopy,
diffraction and spectroscopy: complementary methods for structure
characterization of nanocrystalline materials”
Vasyl P. Klad’ko, Kiev, Ukraine,
“Application of
quasi forbidden reflection for research of multilayer periodic structures”
Michael Knapp, Hamburg, Germany,
“High-resolution
powder diffraction”
Jaros³aw
Majewski, Los Alamos, USA,
“Synchrotron
X-Ray grazing incidence and reflectivity investigation of two-dimensional
arrays of semiconductor nano-crystals at air-water interface“
Adam Pietraszko,
Wroc³aw, Poland,
„Determination of
short-order range using X-ray diffuse scattering”
Ullrich Pietsch, Potsdam, Germany,
„High-resolution
diffraction from lateral nanostructures“
Rados³aw
Przenios³o, Warsaw, Poland,
„High resolution studies
of manganite oxide systems”
Pierre Ruterana, Caen, France,
“Convergent beam
electron diffraction study of inversion domain in GaN“
Janusz Sadowski,
Lund, Sweden,
“Defects in
GaMnAs X-ray diffraction studies”
Oliver Seeck, Hamburg, Germany,
“Advanced methods
to analyze X-ray and neutron reflectivity data”
Zbynek Sourek,
Praha, Czech Republic,
“Lateral periodic
structure in superlattices”
Wojciech
Szuszkiewicz, Warsaw, Poland,
“Neutron scattering
studies of Mn-based semiconductors crystals and superlattices”
Marc Willinger, Berlin, Germany,
“Energy loss
spectroscopy of inelastically diffracted electrons as a tool for structure
investigation“
Peter Zaumseil, Frankfurt (Oder), Germany,
“High resolution
XRD characterization of SiGe:C structures for high frequency microelectronics
applications
CONFERENCE VENUE
Conference was held in Zakopane-winter capital of
Poland, at the recreation house BEL-AMI situated
at the foot of the Tatra Mountains, in a quiet place, close to the city center.
Participants were lodged in well-equipped single and
double rooms and a modern lecture room was available.
Fans of mountaineer’s folklore were fully satisfied with
their stay in Zakopane.
ABSTRACTS & PROCEEDINGS
Abstracts were collected in the Abstracts Boocklet and distributed among
participants.
Selected papers after refereeing procedure will be
published, as a special volume, in Journal
of Alloys and Compounds.
Sunday
13th June
Reception
|
8:00 |
Breakfast |
|
9:00 |
Opening Ceremony |
|
|
9:15 - 10:00 |
Vaclav Holy |
Diffuse X-ray scattering from relaxed
epitaxial layers |
|
10:00 - 10:45 |
Fabia Gozzo |
High-resolution and time-resolved synchrotron
radiation powder diffractometry at the Swiss Light Source |
|
10:45 - 11:15 |
Coffee break |
|
|
11:15 - 12:00 |
Ullrich Pietsch |
Nanoengineering of lateral strain-modulation
in semiconductor quantum well heterostructures by means of X-ray grazing‑incidence
diffraction |
|
12:00 - 12:45 |
Leszek Kepinski |
Microscopy, diffraction and spectroscopy:
complementary methods for structure characterization of nanocrystalline
materials |
|
12:45 - 13:15 |
Jung Ho Je |
Bragg and Fresnel diffraction SR imaging for
studying defects in modern electronic materials |
|
13:30 |
Lunch |
|
|
14:30 |
Open-air panel discussion |
|
|
18:00 |
Dinner |
|
|
19:00 - 19:45 |
Pierre Ruterana |
Convergent beam electron diffraction study of
inversion domain in GaN |
|
19:45 - 20:10 |
Radoslaw Przenioslo |
High resolution studies of manganite oxide
systems |
|
20:30 |
Poster session |
|
|
8:00 |
Breakfast |
|
|
9:00 - 9:45 |
Michela Brunelli
|
Solving crystal structures from powder
diffraction data exploiting anisotropic thermal expansion phenomenon |
|
9:45 - 10:30 |
Jerzy Gronkowski |
X-ray diffuse scattering from statistically
distributed defects |
|
10:30 - 11:15 |
Zbynek Sourek |
Lateral periodic structure in superlattices |
|
11:15 - 11:45 |
Coffee break |
|
|
11:45 - 12:30 |
Marc Willinger |
Energy loss spectra of inelastically
diffracted electrons as a tool for structure investigation |
|
12:30 - 13:15 |
Vladimir Kaganer |
How to extract maximum information
from X-ray diffraction peaks measured with finite resolution |
|
13:30 |
Lunch |
|
|
15:00 - 15:45 |
Tilo Baumbach |
Synchrotron imaging for applied and
industrial research – Applications in Microelectronics and in Micro System
Technology |
|
15:45 - 16:30 |
Wojciech Szuszkiewicz |
Neutron scattering studies of Mn-based
semiconductor crystals and superlattices |
|
16:30 - 17:00 |
Janusz Sadowski |
Defects in GaMnAs X-ray diffraction studies |
|
17:00 - 17:30 |
Coffee break |
|
|
17:30 - 19:00 |
Oral session |
|
|
17:30 - 17:45 |
Stanislav Danis |
Diffuse X-ray scattering from misfit and
threading dislocations in relaxed epitaxial layers |
|
17:45 - 18:00 |
Edyta Piskorska |
Quantitative phase analysis of Ti composites
based on the C-BN |
|
18:00 - 18:15 |
Iraida N. Demtchenko |
Structure characterization of Ge layers
buried in Si matrix by means of TEM |
|
18:15 - 18:30 |
Marcin Krysko |
The influence of lattice parameter variation
on microstructure of single crystals |
|
18:30 - 18:45 |
Danuta Zymierska |
Modification of the nanostructure of the
Si-Ge near–surface layer by laser annealing |
|
18:45 - 19:00 |
Janusz Kozlowski |
Structure modelling and reciprocal space maps
simulation of the (Ga,Al.)N epitaxial layers deposited on sapphire substrate |
|
20:00 |
Conference dinner |
|
|
8:00 |
Breakfast |
|
|
9:00 - 9:45 |
Michael Knapp |
High-resolution powder diffraction |
|
9:45 - 10:30 |
Adam Pietraszko |
Determination of short-order range using
X-ray diffuse scattering |
|
10:30 - 11:15 |
Albert Romano-Rodriguez |
Characterisation of semiconducting materials,
structures and devices using transmission electron microscopy techniques |
|
11:15 - 11:45 |
Coffee break |
|
|
11:45 - 12:30 |
Jurgen Haertwig |
The perfection of protein crystals
characterised by means of synchrotron multiple-crystal topography and
reciprocal space mapping |
|
12:30 - 13:15 |
Henryk Kepa |
Neutron diffraction and reflectivity studies
of Eu-chalkogenides based superlattices |
|
13:30 |
Lunch |
|
|
14:30 |
Excursion Mountain-hiking |
|
|
19:00 |
Dinner |
|
|
20:30 |
Poster session |
|
Thursday
17th June
|
8:00 |
Breakfast |
|
|
9:00 - 9:45 |
Marc DeBoissieu |
Diffuse scattering and phasons fluctuations
in quasicrystals |
|
9:45 - 10:30 |
Peter Zaumseil |
High-resolution XRD characterization of
SiGe:C structures for high frequency microelectronics applications |
|
10:30 - 11:15 |
Jaros³aw Majewski |
Synchrotron X-ray grazing incidence and reflectivity
investigation of two-dimensional arrays of semiconductor nano-crystals at
air-water interface |
|
11:15 - 11:45 |
Oral session |
|
|
11:15 - 11:30 |
Andrey Minkevich |
Eigenwave method for x-ray reflection and
diffraction from supperlattice |
|
11:30- 11:45 |
Sergiy M. Novikov |
Simulation of X-ray acoustic –topography on
defects in Si crystals |
|
11:45 - 12:30 |
Vasyl P. Klad`ko |
Application of quasi forbidden reflection for
research of multilayer periodic structures |
|
12:30 |
Closing remarks |
|
|
13:30 |
Lunch |
|
The
International Conference on Experimental and Computing Methods in High
Resolution Diffraction Applied for Structure Characterization of Modern Materials,
HREDAMM 2004 was organized by the Institute of Physics of the Polish Academy of
Sciences, as a part of the European Centre of Excellence “CEPHEUS” activities.
Conference was held in
Zakopane-winter capital of Poland, at the recreation house BEL-AMI situated at the foot of the Tatra Mountains, in a quiet
place, close to the city center.
One of the missions of the Centre of Photon,
Electron and Ion Advanced Methods for Natural Science “CEPHEUS” is to spread and
increase the knowledge of modern techniques foe examination of new materials as
well as to perform the research to increase the level of confidence in
analysis. These goals gave the strong motivation for the HREDAMM Conference
organization.
The Conference program provides an opportunity
for scientists to meet together for an efficient scientific exchange on the
topic related to different high resolution diffraction methods used for studies
of modern materials. The conference addressed all aspects of high resolution
diffraction. The topics of meeting included advanced experimental diffraction
methods and computer data analysis for characterization of modern materials as
well the progress and new achievements in high resolution diffraction (X-ray,
electrons and neutrons).
Application of these methods for
characterization of modern materials are widely presented among the invited,
oral and poster contributions. The HREDAMM conference, in our opinion,
stimulated the exchange of ideas between the scientists working in the field of
materials characterization by using the diffraction tools.
Selected papers after refereeing procedure will
published, as a special volume, in Journal of Alloys and Compounds.
During 4 days’ meeting 30 lectures were
performed by the invited specialists from all the world, including 15 lecturers
from the best European research centers, invited within the European Community
Program Centre of Excellence “CEPHEUS”. The topics covered new trends in
high-resolution diffraction, computing methods, application to various types of
materials like: bulk crystals, nanocrystals, quasicrystals, thin films and
heterostructures.
Lecturers invited within the the
European Program of the Centre of Excellence “CEPHEUS”
Tilo Baumbach, Dresden, Germany,
“mm-resolved rocking curve imaging for the
characterization of semiconductor materials”
Michela Brunelli, Grenoble, France,
“Solving crystal
structures from powder diffraction data exploiting anisotropic thermal
expansion phenomenon”
Stanislav Danis, Praha, Czech Republic,
„Diffuse X-ray
scattering from misfit and threading dislocations in relaxed epitaxial layers”
Marc
DeBoissieu, Grenoble, France,
“Diffuse
scattering and phason fluctuations in quasicrystals”
Jurgen Härtwig, Grenoble, France,
“X-ray
diffraction and reciprocal space mapping of protein crystals”
Vaclav Holy, Brno, Czech Republic,
„Lateral
coherence mosaicity and dislocations density
at wide-gap
semiconductors”
Vladimir Kaganer, Berlin, Germany,
“How to extract maximum
information from X-ray diffraction peaks measured with finite resolution“
Michael Knapp, Hamburg, Germany,
“High-resolution
powder diffraction”
Ullrich Pietsch, Potsdam, Germany,
„High-resolution
diffraction from lateral nanostructures“
Pierre Ruterana, Caen, France,
“Convergent beam
electron diffraction study of inversion domain in GaN“
Janusz Sadowski,
Lund, Sweden,
“Defects in
GaMnAs X-ray diffraction studies”
Oliver Seeck, Hamburg, Germany,
“Advanced methods
to analyze X-ray and neutron reflectivity data”
Zbynek Sourek,
Praha, Czech Republic,
“Lateral periodic
structure in superlattices”
Marc Willinger, Berlin, Germany,
“Energy loss
spectroscopy of inelastically diffracted electrons as a tool for structure investigation“
Peter Zaumseil, Frankfurt (Oder), Germany,
“High resolution
XRD characterization of SiGe:C structures for high frequency microelectronics
applications
In the conference participated 60 participants from:
Poland, Germany, France, Spain, Sweden,
Belarus, Ukraine, Czech Republic, Slovak Republic, USA, Switzerland,
Korea.