|
|
|
J.
Baruchel, J. Härtwig, P. Pernot-Rejmánková
|
Development
in the Characterisation of Defect Structures
|
|
P. Carpentier,
P. Boesecke, J.-M. Bois, M.-L. Chesne, E. Fanchon, R. Kahn, H. Stuhrmann,
J. Vicat
|
Soft
X-ray diffraction up to wavelengths of 6.0 A becomes feasible at ID1 of
ESRF
|
|
Z.
Dauter
|
Frontiers
of diffraction: resolution limits.
|
|
A.N.
Fitch
|
Crystal
Structures from High Resolution Powder X-Ray Diffraction Data
|
|
S.S.
Funari , G.
Rapp, A. Meyer, F. Richter
|
Small
Angle X-Ray Scattering Studies of Biomolecules
|
|
J.R.
Helliwell
|
Complementarity
Of Neutron and Ultra-High Resolution Synchrotron X-ray Protein Crystallography
Studies
|
|
G. Materlik, P. Korecki
|
From Atomic Resolution X-Ray Holography to Real Space Imaging |
|
W.
Minor
|
MinorData
Acquisition and Processing in Structural Genomics Era Automatic or Remotely
Controlled Expert System
|
|
B. Palosz
|
High
Pressure X-ray Powder Diffraction: Application to Studies on Nanocrystals
|
|
A.
Snigirev
|
Development
of Hard X-ray Optics for Synchrotron Radiation
|
|
E.
Weckert
|
Novel
Sources for Synchrotron Light
|
|
M.
Wilmanns
|
Structural
biology in the postgenomic era
|
|
T.
Wroblewski
|
MAXIM
- A method for the position resolved characterization of polycrystalline
materials
|
|
J. Bak-Misiuk,
E. Dynowska, J. Adamczewska, A. Misiuk, K. Reginski, J.Trela, J.
Domagala, D. Dobosz
|
X-Ray
Study of Directional Strain Relaxation in Heteroepitaxial Algaas Layers
Annealed under High Hydrostatic Pressure
|
|
A.
Burian, A. Jablonska, A.M. Burian, D. LeBolloch, H. Metzger,
O. Proux, J.L. Hazemann
|
Application
of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials:In-Se
Amorphous Films
|
|
A. Burian, A. Szczygielska,
J. Koloczek, J.C. Dore, V. Honkimaki
|
Curved
Surfaces In Disordered Carbons By High Energy X-Ray Diffraction
|
|
|
|
|
V.F.
Degtyareva
|
Phase
Transformations in Binary Alloys under High Pressure
|
|
R.D.
Durst, J. Phillips, T. Wagner, E.R. Hovestreydt
|
On
A Large-Area, Lens-Coupled Ccd Detector
|
|
E. Dynowska
, W. Szuszkiewicz, W. Paszkowicz, J. Domagala,
C. Lathe, A. Fleszar, E.K.U. Gross, B. Morin, M. Fischer
|
Elastic
Properties of HgSe: Experiment and Calculations
|
|
Fodchuk
I.M., Gimchynsky O.G., Gutsulyak T.G., Raransky M.D., Masivuk V.T.
|
Structural
Changes in Si Crystals Caused by High-Energy Electronic Exposure
|
|
I. Frymark, A. Matyszkiewicz,
A. Jeziorska, A. Krotkus, G. Kowalski
|
X-ray
Diffraction Stufy of Be-doped GaAs Crystals
|
|
H. Grigoriew, A.
Woliñska-Grabczyk
|
SAXS
Synchrotron Study of Temperature Transition in the System: Polyurethane-Solvent.
|
|
S.A.
Grigorian, J. Grenzer, U. Pietsch, U. Zeimer, S. Gramlich, F. Bugge, M.
Weyers, G.Tränkle
|
Grazing-Incidence
Diffraction Study of a Strain-Modulated Single Quantum Well Nanostructures
|
|
J.
Grochowski
|
SR
HRPD verifies scheme of stereospecific synthesis
|
|
P. Grochulski,
J. Allard, J. Sygusch
|
Covalent
Intermediate Trapped in Kdpg Aldolase Structure at 1.95 Å
|
|
Gyngazov
L.N., Tiutiunnikov S.I.
|
The
Curvature of Crystal Surface Taken into Account in the Problem of X-ray
Bragg Focusing
|
|
J.
Janicki
|
Nanostructure
and Thermal Behaviour of Liquid Crystal Oligoester
|
|
Yu.P.
Khapachev, A.A. Dyshekov, R.N. Kyuff, V.A. Elyukhin
|
The
X-ray Diffraction Investigation of New Crystal Modification of GaP
|
|
V.P.
Klad’ko, L.I. Datsenko, S. Manninen, V.B. Molodkin, V.F. Machulin
|
Effect
of Structure Imperfections on the Energy Dependences for the Friedel Pair
of Intensities in the Region of Anomalous Dispersion
|
|
N.
Kulagin
|
High
Resolution X Ray Spectroscopy and Change of Valency of Ions in Solids
|
|
A.
Lausi, M. Kopecky, E. Busetto, A. Savoia
|
X-ray
Holography with a Position Sensitive Detector
|
|
K. Lawniczak-Jablonska,
E. Benko, I. N. Demchenko, E. Piskorska, A. Benko, E. Welter, T. L. Barr.
|
X-ray Absorption Studies of the New Phases Formation in cBN-Ti
and Cr Based Composites.
|
|
K. Lawniczak-Jablonska,
K.S. Zhuravlev, I N. Demchenko, E. Piskorska, E. Welter
|
Quantum
Dots Observation in Ge Layers Buried in Silicon Using X-Ray Absorption
|
|
C.B.
Mammen, J. Als-Nielsen, S. Larsen
|
Optical
Elements at the Cassiopeia-911 Beamline at MAX-II, Lund
|
|
S. Miotkowska, E.
Dynowska, I. Miotkowski, P.A. Metcalf, A. Lewicki, A.K. Ramdas
|
Solubility
and Segregation of Co in Cdte-Based Ternary and Quaternary Alloys Grown
by Vertical Bridgman Technique
|
|
A.
Misiuk, A. Barcz, J. Ratajczak, H.B. Surma, J. Bak-Misiuk,
I.V. Antonova, J, Härtwig
|
Oxygen
Precipitation in Si:O Annealed Under High Hydrostatic Pressure of Ambient
Gas
|
|
V.B.
Molodkin, M.B. Shevchenko, O.V. Pobydaylo
|
Diagnosis of Bent Crystal and Smoothing of Deformation in
X-Ray Asymmetrical Diffraction
|
|
V.B.
Molodkin ,
S.l. Olikhovskii, E.N. Kislovskii, M. Ando, T.P. Vladimirova, O.V. Reshetnyk,
E.A. Evgrafova, M.M. Belova
|
Characterization
of the Float-Zone Silicon by High-Resolution Double- and Triple- Crystal
X-ray Diffractometry
|
|
Borcha
M.D., Fodchuk I.M., Kshevetsky O.S., Raransky M.D.
|
Multiple
X-ray Difractometry of Thin Subsurface Crystal Layers
|
|
Novikov
S.M., Raransky M.D., Fodchuk I.M., Zaplitny R.V., Strusovsky I.A.
|
Dynamic
X-ray Scattering Under Condition of Combined Structure Distortions in Crystal
|
|
S.I.
Olikhovskii, E.N. Kislovskii, V.B. Molodkin, B.K. Ostaphiychuk,
E.G. Len', T.P. Vladimirova
|
New
Method for the Synchrotron Characerization of Structural Defects and Strain
in Ion-Implanted Single-Crystalline Materials
|
|
W.
Paszkowicz, R. Cerny, S. Krukowski
|
Rietveld
Refinement for Indium Nitride in the 105-295 K Temperature Range
|
|
W. Paszkowicz, M.
Knapp, S. Podsiadlo, G. Kamler, J.B. Pelka
|
Lattice
Constants of Aluminium Nitride in 10-291 K Temperature Range
|
|
W. Paszkowicz, A.
Yamaguchi, W Szuszkiewicz, C. Lathe, E. Dynowska, J.Z. Domagala
|
High-Pressure
Diffraction Study of a
'-Al
2CO
|
|
J.B.
Pelka, M. Brust, W. Paszkowicz, P. Gierlowski, N. Schell, A. Bauer
|
Structural
Characterization of Self-Assemblcd Multilayer Thin Films of Gold Nanoparticles
by X-Ray Diffraction and Reflectometry
|
|
J.B.
Pelka, W. Paszkowicz, P. Gier³owski, M. Zieliñski, S.J. Lewandowski,
S. Barbanera, M. Knapp
|
Characterization
of Thin Films Deposited by Laser Ablation on Cold Substrates from YBaCuO
Targets by X-ray Diffraction and Related Methods
|
|
Raransky
M.D., Struk Ya.M., Fesiv I.V., Fodchuk I.M.
|
X-Ray
Interferometry Method for Research of Epitaxial Layers
|
|
S
.Schmidt, B.M. Lauridsen, R.M. Suter, H.F. Poulsen
|
GRAINDEX:
an Algorithm for Structural Characterization of Grains in Powders or Polycrystals
|
|
I.A.
Sheremetyev, S.V. Gorfman
|
Method of Crystal Sighted Indexing and Computer System -The
Wulff Telescope
|
|
T. Skalova, J. Hasek,
J. Dohnalek, H. Petrokova
|
Crystal
Structure Of Mutant Hiv-1 Protease In Complex With Tetrapeptide Inhibitor
|
|
E.
Sozontov, L.X. Cao, A. Kazimirov, V. Kohn, M. Cardona, J. Zegenhagen
|
X-Ray
Standing Wave Analysis of the Influence of Isotopic Composition on the
Lattice Constant of Ge
|
|
D.I.
Svergun
|
New
methods of X-ray and neutron solution scattering data analysis and their
applications
|
|
V.A.
Tatarenko, T.M. Radchenko
|
Time-Dependent
Evolution of a Diffuse Scattering of X-Rays in F.C.C. Solid Solutions
|
|
T.
Ursby, M. Thunnisen, C.B. Mammen, Y. Cerenius, J. Nilsson, B. Sommarin,
J. Als-Nielsen, S. Larsen, A. Liljas,
|
The
New Macromolecular Crystallography Stations at
MAX-lab
|
|
A. Waskowska, H.G. Krane, L. Gerward, J. Staun Olsen, E. Malicka
|
Magnetostriction
effect in CdCr2-xGaxSe4 (x = 0.02 and
0.06)
|
|
M.S.
Weiss, T. Sicker, K. Djinovic-Carugo, R. Hilgenfeld,
|
On
the Routine Use of Soft X-rays in Macro-molecular Crystallography
|
|
K. Wieteska, W. Wierzchowski,
W. Graeff, M. Lefeld-Sosnowska, M. Regulska
|
Interference
Fringes in the Plane Wave Topographic Images of Growth Bands in Si:Ge
|
|
A. Zieba,
W. Dabrowski, P. Grybos, W. Powroznik, T. Stobiecki, K. Swientek, J.
Slowik, P. Wiacek
|
Prototype
Silicon Position-Sensitive Detector Working With theta-2
theta Diffractometer
|
|
D. Zymierska,
K. Godwod, J. Adamczewska, J. Auleytner, J. Choinski, K. Reginski
|
Fine
Diffraction Effects In Si Single Crystals Implanted With Fast Ar Ions And
Annealed
|