Head of the division:	Dr hab. Krystyna Jablonska-Lawniczak jablo@
Secretary:	Ms. Halina Granat granat@
Phone:	843-60-34,   843-70-01 ext. 197

SL-1.1	Group for Real Structure Research
SL-1.2	X-ray Optics Group
SL-1.3	Applied Crystallography Group
SL-1.4	Electron Microscopy Group
SL-1.5	Group of X-ray Spectroscopy and Microanalysis
SL-1.6	Group of Secondary Ion Mass Spectrometry

Main subject of research:

1. Determination of real crystal structural parameters by X-ray and electron diffraction methods
2. Investigation of crystal defects by X-ray topography and electron microscopy
3. X-ray microprobe investigations of chemical composition and bonding effects in new materials
4. X-ray and photoelectron studies of the electronic structure of materials
5. EXBIFS and EXAFS investigation of local structure in solids
6. New methods of investigation of atomic and electronic structure in interface layers and materials used in technology of electronic devices

Major facilities:

• High resolution transmission electron microscope JEM 2000 EX (JEOL)
• High Resolution Material Research Diffractometer PHILLIPS equipped with Bartels (440), Bartels (220) monochromators and Ge (1, -1) analyzer
• Electron probe microanalyser JXA-50A, with scanning electron microscope and X-ray energy dispersive spectrometer LINK (JEOL)
• Deep level relaxation spectrometer DLTS (made in Hungary)
• Double axis X-ray diffractometer of Bond type with temperature chamber, equipped with 4 crystal monochromators of Bartels type (selfmade)
• Automated diffractometer for powders and flat single crystals (selfmade)
• Automated diffractometer for powders (selfmade)
• X-ray double-crystal spectrometer for standing wave investigation (selfmade)
• X-ray triple-crystal spectrometer for rocking curve measurements (selfmade)
• Soft X-ray grating spectrometer RSM-500 (made in USSR)
• Bremsstrahlung isochromat spectrometer (selfmade)
• Electron Diffractometer (RHEED, TED) ENR-102 (made in USSR)

Laboratory and its activities:  PHOTOS