List of Invited Speakers
Friedhelm Bechstedt (Friedrich
Schiller Universität, Jena, Germany)
Optical spectra of
semiconductors from first principles
Alberto Bramati
(Université Pierre et Marie Curie - Paris 6, France)
Superfluidity of microcavity polaritons
Enrique Calleja
(Universidad Polite´cnica de Madrid, Spain)
On the spontaneous and ordered growth of III-N nanocolumns: growth on
nonpolar substrates and applications to Optoelectronic Devices
£ukasz
Cywiñski
(Institute of Physics PAS, Warsaw, Poland)
Dephasing
of electron spin qubits due to their interaction with nuclei in quantum
dots
Tomasz Kazimierczuk (University
of Warsaw, Poland)
Spectroscopy of CdTe/ZnTe quantum dots
Olivier Krebs (LPN-CNRS,
Marcoussis, France)
Magneto-optical properties of self-assembled InAs/GaAs quantum dots doped
by a single Mn atom
Jacek Majewski (University
of Warsaw, Poland)
Functionalized carbon nanotubes – a key to nanotechnology?
Laurens Molenkamp (Universitaet
Wuerzburg, Germany)
Dirac Fermions in HgTe Quantum Wells
Milan Orlita (High
Magnetic Field Laboratory, Grenoble, France)
Optical
spectroscopy of graphene and graphite
Piotr Perlin (Institute
of High Pressure Physics PAS, Warsaw, Poland)
New
concepts of nitride light emitters
David Ritchie (University
of Cambridge, UK)
Single-Photon and Entangled-Photon Sources for Quantum Information
Gian Salis (IBM
Research, Zurich, Switzerland)
Spin precession in the combined Rashba- and Dresselhaus-field of a
two-dimensional electron gas
Symposium:
"(Nano)characterization Methods for Semiconductors"
Francesco d'Acapito
(ESRF, Grenoble, France)
X-ray Absorption Spectroscopy in the nanocharacterization of semiconducting systems
Martin Albrecht
(IKZ, Berlin, Germany)
High resolution transmission electron microscopy of semiconductor low-
dimensional systems
Tomasz
Durakiewicz (Los Alamos National Laboratory,
USA)
High resolution photoemission spectroscopy of systems with strongly correlated
f-electrons
Edward A. Görlich (Jagiellonian University, Krakow, Poland)
Polish Synchrotron Radiation Source - Current Status
Ferdinand Hofer
(Graz University of Technology, Graz, Austria)
The advanced sensitivity
of EFTEM
Vaclav Holy (Charles
University, Prague, Czech Republic)
Investigation
of nanostructures by synchrotron x-ray scattering techniques
Serge Huant
(Institut Néel, CNRS/UJF, Grenoble, France)
Scanning-gate microscopy of semiconductor nanostructures: an overview
Paul M. Koenraad
(Eindhoven University of Technology, The
Netherlands)
Semiconductor nanostructure formation and doping studied at the atomic
scale by cross-sectional scanning tunneling microscopy
Pawe³ Korecki (Jagiellonian
University, Krakow, Poland)
Atomic-Scale Imaging by means of X-ray Absorption Anisotropy
Sébastien Sauvage
(Université Paris-Sud, Orsay, France)
Absorption
nanospectroscopy of single quantum dots in the infrared
Claus
M. Schneider (Institute of Solid State
Research, IFF, Jülich)
Spectromicroscopy with Synchrotron Radiation: Past, Present, and Future
Krystyna Stiller
(Chalmers University of Technology, Goteborg)
To see
and to catch atoms. What can we learn using atom probe tomography ?
Alberta Bonanni
(Johannes
Kepler Universitaet, Linz, Austria) - chairperson
of the
symposium and moderator
of the rump session